METHOD OF ANALYSING QUANTUM EFFICIENCY OF SEMICONDUCTOR LIGHT-EMITTING DEVICE AND ANALYSIS SYSTEM USING SAID METHOD

FIELD: physics. ^ SUBSTANCE: method involves providing an image of the semiconductor layer of a semiconductor light-emitting device, conversion of this image to a binary image, obtaining a Reni dimension Dq for degree q as a multifractal analysis parametre of the binary image, and determination of t...

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Hauptverfasser: SHMIDT NATALIJA MIKHAJLOVNA, LI KHIUN DZUNG, KIM BAE KIUN, BRUN'KOV PAVEL NIKOLAEVICH, CHERNJAKOV ANTON EVGEN'EVICH, KOLMAKOV ALEKSEJ GEORGIEVICH
Format: Patent
Sprache:eng ; rus
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