DEVICE FOR MEASURING ANGULAR DEPENDENCIES OF SPECTRAL RATIOS OF INFRARED RADIATION OF MATERIALS

FIELD: physics. ^ SUBSTANCE: device consists of a cylindrical vacuum chamber in which there is a cooling screen, material test specimen with a heater, fixed on a rotating suspension, and an optical measuring system, consisting of a monochromator, modulator, infrared lenses and a radiation receiver....

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Bibliographische Detailangaben
Hauptverfasser:	VITKOVSKIJ VJACHESLAV VLADIMIROVICH, POTAPOV JURIJ FEDOROVICH, GORSHENEV VIKTOR GRIGOR'EVICH
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	FIELD: physics. ^ SUBSTANCE: device consists of a cylindrical vacuum chamber in which there is a cooling screen, material test specimen with a heater, fixed on a rotating suspension, and an optical measuring system, consisting of a monochromator, modulator, infrared lenses and a radiation receiver. The sample is heated either by infrared radiation or by electrical current due to ohmic resistance. ^ EFFECT: measurement of angular dependencies of spectral ratios of radiation. ^ 2 dwg