METHOD OF METROLOGICAL TEST AND CERTIFICATION OF STATISTIC CHARACTERISTICS OF ANALOG-TO-DIGITAL CONVERTERS AND DEVICE FOR IMPLEMENTATION OF METHOD

FIELD: physics, measurement. ^ SUBSTANCE: invention concerns measurement and computation equipment. To achieve the objective, the method involves weakening of periodic measuring signal (MS) to reduce quantisation noise and its shift by displacement signal over the whole dynamic range of tested AD converter at a pitch with rating value close to quantisation pitch of tested AD converter. At each pitch a local code histogram from the tested AD converter is collected in peak-to-peak signal range, excluding codes on the borders of measuring signal. Further the number of codes corresponding to each quantisation interval of tested AD converter is summed in a common histogram. Device includes measuring signal generator, as well as guided attenuator, source of displacement signal for measuring signal, measuring signal shift circuit, microcontroller and computer. ^ EFFECT: possibility of metrological test and certification of statistic characteristics of precision analog-to-digital converters with less strict requirements to sample media by transition from precision measurement devices to precision methods. ^ 3 cl, 3 dwg