METHOD FOR MEASURING TRANSITIVE RESISTANCE OF CONTACT TO THIN-FILM RESISTORS WITH ELECTRODES

FIELD: electric engineering. ^ SUBSTANCE: resistance measuring method includes letting a current of given value through edge and middle electrodes of thin-film resistor with three electrodes. Voltage is measured between middle and second edge electrodes. Transitive resistance of contact is determine...

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1. Verfasser: VLASOV GENNADIJ SERGEEVICH
Format: Patent
Sprache:eng ; rus
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Zusammenfassung:FIELD: electric engineering. ^ SUBSTANCE: resistance measuring method includes letting a current of given value through edge and middle electrodes of thin-film resistor with three electrodes. Voltage is measured between middle and second edge electrodes. Transitive resistance of contact is determined according to formula where B - measured voltage, I - current of given value, K - coefficient, reverse of coefficient a11 of chain matrix, produced as a result of electric modeling of contact area. ^ EFFECT: increased precision when measuring transitive resistance of a contact of thin-film resistor. ^ 3 dwg