METHOD FOR MEASURING HEIGHT OF MELT ALUMINUM LAYER ON BOTTOM OF ALUMINUM CELL

FIELD: non-ferrous metallurgy, production of aluminum by electrolysis, namely measuring height of melt aluminum layer on cell bottom. ^ SUBSTANCE: method comprises steps of measuring distance from reference point of steel rod till trace of inter-phase boundary of electrolyte and melt aluminum formed...

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Hauptverfasser: AKHMETOV SERGEJ ILAEVICH, TOLKACHEV ALEKSEJ IVANOVICH, MIKHALEV JURIJ GLEBOVICH, ZAVADJAK ANDREJ VASIL'EVICH, TREBUKH DMITRIJ ALEKSANDROVICH, PINGIN VITALIJ VALER'EVICH
Format: Patent
Sprache:eng ; rus
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Zusammenfassung:FIELD: non-ferrous metallurgy, production of aluminum by electrolysis, namely measuring height of melt aluminum layer on cell bottom. ^ SUBSTANCE: method comprises steps of measuring distance from reference point of steel rod till trace of inter-phase boundary of electrolyte and melt aluminum formed at vertical immersion of said rod into electrolyte and melt aluminum; fixing rod relative to flange of beam-collector by means of bracket supporting guides; measuring distance from reference point applied on part of steel rod non-immersed into electrolyte and melt aluminum till trace of inter-phase boundary of electrolyte and melt aluminum on said rod; determining layer height as difference between distance from rod fixation point till cell bottom, distance from rod fixation point till reference point and distance from reference point till trace of inter-phase boundary. ^ EFFECT: enhanced accuracy and reliability of measuring height of layer of melt aluminum on cell bottom. ^ 2 cl, 1 dwg