PROBE BASED ON QUARTZ RESONATOR FOR SCANNING PROBE MICROSCOPE

FIELD: nano technology, namely, devices providing receipt of information about condition of surface using scanning probe microscopy. ^ SUBSTANCE: probe based on quartz resonator for scanning probe microscope contains quartz resonator with first and second shoulders, held on which are respectively fi...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	SOKOLOV DMITRIJ JUR'EVICH
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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