METHOD FOR EVALUATING INITIAL DEGREE OF RECRYSTALLIZATION
FIELD: mechanical engineering. ^ SUBSTANCE: proposed method that can be used in production of electronic devices, analysis of fibrous-structure refractory metals and alloy TsM2A sheets and their checking for manufacturability includes detection of round grains by means of 900-1000 microscope and eva...
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Format: | Patent |
Sprache: | eng ; rus |
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Zusammenfassung: | FIELD: mechanical engineering. ^ SUBSTANCE: proposed method that can be used in production of electronic devices, analysis of fibrous-structure refractory metals and alloy TsM2A sheets and their checking for manufacturability includes detection of round grains by means of 900-1000 microscope and evaluation of fiber microhardness loss at points of their accumulation. Prior to stamping parts blanks undergo additional annealing at user's to optimize their microstructure and to facilitate sheet manufacture. ^ EFFECT: enhanced yield of stampings. ^ 1 cl, 2 dwg |
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