MEASURING SYSTEM WITH LOGARITHMIC FREQUENCY OUTPUT

FIELD: measuring technique. ^ SUBSTANCE: system comprises signal input, unit for processing measurement results, computing device, and signal output. The internal cadence signal is supplied to the unit for processing the measurement results. The measuring signal is supplied to the signal input, and...

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Bibliographische Detailangaben
Hauptverfasser:	NOJSHELER MARKO, LOISHTL' KHANS, KHAG AKSEL'-VERNER, BRJUKKNER JERG, SHTRORMANN MANFRED, RAJSHL' ROL'F
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL METERING BY VOLUME PHYSICS SIGNALLING TARIFF METERING APPARATUS TESTING TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS
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Beschreibung
Zusammenfassung:	FIELD: measuring technique. ^ SUBSTANCE: system comprises signal input, unit for processing measurement results, computing device, and signal output. The internal cadence signal is supplied to the unit for processing the measurement results. The measuring signal is supplied to the signal input, and computing device generates output signal on the basis of cadence signal and measuring signal. The reference signal generated on the basis of the cadence signal is supplied to the unit for processing the results of measurements and is used for correction of the output signal. ^ EFFECT: enhanced accuracy of measurements. ^ 3 cl, 11 dwg