DEVICE FOR X-RAY CONTROL OF THICKNESS OF LAYERS OF THREE-LAYERED METALLIC BELT
FIELD: x-ray control of thickness of layers in three-layered metallic belt. ^ SUBSTANCE: introduced are additional source of x-ray radiation, second collimator rigidly connected to window of emitter of additional x-ray source and third and fourth detectors with third and fourth collimators, also con...
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Format: | Patent |
Sprache: | eng ; rus |
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Zusammenfassung: | FIELD: x-ray control of thickness of layers in three-layered metallic belt. ^ SUBSTANCE: introduced are additional source of x-ray radiation, second collimator rigidly connected to window of emitter of additional x-ray source and third and fourth detectors with third and fourth collimators, also connected rigidly to respectively third and fourth detectors, forming transforming units, while additional source of x-ray radiation with second collimator are positioned on the other side of belt as mirror reflection of flow of first x-ray radiation source along the normal, and outputs of high voltage source are made counter-phased, while third and fourth transforming units are positioned on different sides of surfaces of belt normally to flows of direct radiation from first and additional x-ray sources, reflected from structure of material, and are positioned with collimators facing reflected flows, first, second, third and fourth collimators are made in thin flat shape in form of a slit, direction of each of which is oriented in parallel to one another along transverse section of belt, while transforming units are capable of scanning relatively to their centers, in plane, formed by combined normal of direct flows and first and additional x-ray sources and longitudinal axis of ribbon, passing across the middle of its internal layer, for angle, overlapping width of aperture of collimated direct flows. ^ EFFECT: expanded functional capabilities, increased precision and resolution when measuring thickness of each metallic layer of three-layered belt. ^ 1 dwg |
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