STRAIN GAUGE

FIELD: test equipment; devices for measurement of elongation of tested sample. ^ SUBSTANCE: elastic beam of strain gauge has one end attached to one of cases in parallel to tested sample. The other end of elastic beam rests against inclined surface of wedge fixed at second case. Device for compressi...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	POTAENKO EVGENIJ NIKOLAEVICH, BUGAETS ALEKSANDR IVANOVICH, RODIONOV ANATOLIJ VASIL'EVICH, CHILIKOV STANISLAV MIKHAJLOVICH, KRAVCHENKO ALEKSEJ FEDOROVICH
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	FIELD: test equipment; devices for measurement of elongation of tested sample. ^ SUBSTANCE: elastic beam of strain gauge has one end attached to one of cases in parallel to tested sample. The other end of elastic beam rests against inclined surface of wedge fixed at second case. Device for compressing supports against sample can be made in form of bushings fastened to any case by means of arm-pieces and axes of bushings are perpendicular to axis of tested sample. Spring-loaded rod is disposed inside bushings; pin of rod is disposed diametrically. Rod has its end rests against tested sample by means of spring to press supports against sample. Wedge can be made replaceable to have different helix angles relatively axis of sample. Strain gauge provides practically unlimited value of deformation travel due to variations in of helix angle of wedge including destroy of sample without taking risk of damage of elastic beam. ^ EFFECT: unlimited deformation travel. ^ 3 cl, 1 dwg