DEVICE FOR X-RAY INSPECTION OF THICKNESS OF SHEET ITEMS

FIELD: non-destructive inspection; X-ray technology. ^ SUBSTANCE: device has X-ray radiation source, first and second radiation detectors, processing circuit and registrar. Detectors with different spectral sensitivities are used. The detectors are disposed one after another in such a way to make co...

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Bibliographische Detailangaben
Hauptverfasser:	ARTEM'EV B.V, ZAPUSKALOV V.G, GUSEV V.E, MASLOV A.I, VOLCHKOV JU.E
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	FIELD: non-destructive inspection; X-ray technology. ^ SUBSTANCE: device has X-ray radiation source, first and second radiation detectors, processing circuit and registrar. Detectors with different spectral sensitivities are used. The detectors are disposed one after another in such a way to make contact to each other at the side being opposite to where X-ray source is located. ^ EFFECT: improved precision of measurement; improved sensitivity. ^ 1 dwg