METHOD FOR DETECTING DEFECTS IN DIGITAL BLOCKS

FIELD: measuring equipment. ^ SUBSTANCE: in turns, on each device, included in diagnosed block, feeding voltage amplitude is decreased in steps from nominal value Enom to threshold value Ethri with step DeltaEn, while on each step of decreasing of amplitude of feeding voltage of device pseudo-random...

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Bibliographische Detailangaben
Hauptverfasser:	REBROV A.S, SKACHKOV S.A, ESIN JU.I, DANILOV O.A
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	FIELD: measuring equipment. ^ SUBSTANCE: in turns, on each device, included in diagnosed block, feeding voltage amplitude is decreased in steps from nominal value Enom to threshold value Ethri with step DeltaEn, while on each step of decreasing of amplitude of feeding voltage of device pseudo-random multi-digit code sets are sent to inputs of diagnosed block, consisting of logical zeroes and ones with even possibility of appearance of logical zero or logical one in each digit, received logic levels are recorded on outputs of diagnosed digital block and compared to standard levels, and when error frequency Fc appears, voltage value Ethri is recorded (functioning threshold) for each device and its functioning area is calculated on basis of feeding voltage DeltaEpi. Defective (potentially malfunctioning) device is detected on basis of lowest value in functioning area DeltaEpi, which is selected on basis of comparison of functioning areas of all devices, included in diagnosed digital block. ^ EFFECT: higher precision, higher efficiency. ^ 1 dwg