DEVICE FOR DETERMINING COORDINATES OF DEFECTS
FIELD: measuring instruments. ^ SUBSTANCE: device has converter of linear displacements, screen for inspecting the material for defects, inspection reference line of material defects made of movable transparent rule provided with a set of light guides, meter of the coordinates of material defects, a...
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Format: | Patent |
Sprache: | eng ; rus |
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Zusammenfassung: | FIELD: measuring instruments. ^ SUBSTANCE: device has converter of linear displacements, screen for inspecting the material for defects, inspection reference line of material defects made of movable transparent rule provided with a set of light guides, meter of the coordinates of material defects, and computing block. The coordinate meter of material defects is kinematically coupled with the transparent rule. The member for reading information from the coordinate meter of material defects is connected with the microprocessor for correcting the results of measuring the length of moving material of the computing block. The optron disk of the material defect coordinate meter is axially aligned to one of the free rotating rollers of the displacement mechanism of the transparent rule for their joint translational motion. ^ EFFECT: enhanced accuracy of measurements. ^ 1 dwg |
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