INTERFEROMETER
FIELD: measurement of optical characteristics of substances, optical detection of material components. SUBSTANCE: given interferometer has optically coupled light radiation source, reflecting plate made of optically clear substance with refractive index n1, beam splitting element, matrix periodic sy...
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| creator | ATNASHEV P.V BOJARCHENKOV A.S ATNASHEV V.B ATNASHEV A.V |
| description | FIELD: measurement of optical characteristics of substances, optical detection of material components. SUBSTANCE: given interferometer has optically coupled light radiation source, reflecting plate made of optically clear substance with refractive index n1, beam splitting element, matrix periodic system of photocells ganged to it, spectrum analyzer, at least one thin partially transmitting layer having thickness under lambda/2, placed between source of luminous radiation and reflecting plate at angle theta, found from relationship sintheta = lambda/2d, where theta is angle included between thin partially transmitting layer and wave front of light wave; lambda is length of light wave; d is period of interference bands. Interferometer displays capability of attachment of analyzed material component to surface of reflecting plate, zones of solution can be located on surface of component. Reflecting plate is made of optically clear substance with refractive index n1 chosen from relationship n1 |
| format | Patent |
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SUBSTANCE: given interferometer has optically coupled light radiation source, reflecting plate made of optically clear substance with refractive index n1, beam splitting element, matrix periodic system of photocells ganged to it, spectrum analyzer, at least one thin partially transmitting layer having thickness under lambda/2, placed between source of luminous radiation and reflecting plate at angle theta, found from relationship sintheta = lambda/2d, where theta is angle included between thin partially transmitting layer and wave front of light wave; lambda is length of light wave; d is period of interference bands. Interferometer displays capability of attachment of analyzed material component to surface of reflecting plate, zones of solution can be located on surface of component. Reflecting plate is made of optically clear substance with refractive index n1 chosen from relationship n1<n2- where n2- is refractive index of solution. Matrix periodic system of photocells is mounted for turn around optical axis of interferometer. Proposed interferometer can find application for diagnostics of state of man's skin. EFFECT: capability to record distribution and location of numerous zones of solution on surface with the help of simple optical device. 1 dwg</description><edition>7</edition><language>eng ; rus</language><subject>COLORIMETRY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20031127&DB=EPODOC&CC=RU&NR=2217713C1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20031127&DB=EPODOC&CC=RU&NR=2217713C1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ATNASHEV P.V</creatorcontrib><creatorcontrib>BOJARCHENKOV A.S</creatorcontrib><creatorcontrib>ATNASHEV V.B</creatorcontrib><creatorcontrib>ATNASHEV A.V</creatorcontrib><title>INTERFEROMETER</title><description>FIELD: measurement of optical characteristics of substances, optical detection of material components. SUBSTANCE: given interferometer has optically coupled light radiation source, reflecting plate made of optically clear substance with refractive index n1, beam splitting element, matrix periodic system of photocells ganged to it, spectrum analyzer, at least one thin partially transmitting layer having thickness under lambda/2, placed between source of luminous radiation and reflecting plate at angle theta, found from relationship sintheta = lambda/2d, where theta is angle included between thin partially transmitting layer and wave front of light wave; lambda is length of light wave; d is period of interference bands. Interferometer displays capability of attachment of analyzed material component to surface of reflecting plate, zones of solution can be located on surface of component. Reflecting plate is made of optically clear substance with refractive index n1 chosen from relationship n1<n2- where n2- is refractive index of solution. Matrix periodic system of photocells is mounted for turn around optical axis of interferometer. Proposed interferometer can find application for diagnostics of state of man's skin. 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SUBSTANCE: given interferometer has optically coupled light radiation source, reflecting plate made of optically clear substance with refractive index n1, beam splitting element, matrix periodic system of photocells ganged to it, spectrum analyzer, at least one thin partially transmitting layer having thickness under lambda/2, placed between source of luminous radiation and reflecting plate at angle theta, found from relationship sintheta = lambda/2d, where theta is angle included between thin partially transmitting layer and wave front of light wave; lambda is length of light wave; d is period of interference bands. Interferometer displays capability of attachment of analyzed material component to surface of reflecting plate, zones of solution can be located on surface of component. Reflecting plate is made of optically clear substance with refractive index n1 chosen from relationship n1<n2- where n2- is refractive index of solution. Matrix periodic system of photocells is mounted for turn around optical axis of interferometer. Proposed interferometer can find application for diagnostics of state of man's skin. EFFECT: capability to record distribution and location of numerous zones of solution on surface with the help of simple optical device. 1 dwg</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| language | eng ; rus |
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| subjects | COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS RADIATION PYROMETRY TESTING |
| title | INTERFEROMETER |
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