INTERFEROMETER

FIELD: measurement of optical characteristics of substances, optical detection of material components. SUBSTANCE: given interferometer has optically coupled light radiation source, reflecting plate made of optically clear substance with refractive index n1, beam splitting element, matrix periodic sy...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ATNASHEV P.V, BOJARCHENKOV A.S, ATNASHEV V.B, ATNASHEV A.V
Format: Patent
Sprache:eng ; rus
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Beschreibung
Zusammenfassung:FIELD: measurement of optical characteristics of substances, optical detection of material components. SUBSTANCE: given interferometer has optically coupled light radiation source, reflecting plate made of optically clear substance with refractive index n1, beam splitting element, matrix periodic system of photocells ganged to it, spectrum analyzer, at least one thin partially transmitting layer having thickness under lambda/2, placed between source of luminous radiation and reflecting plate at angle theta, found from relationship sintheta = lambda/2d, where theta is angle included between thin partially transmitting layer and wave front of light wave; lambda is length of light wave; d is period of interference bands. Interferometer displays capability of attachment of analyzed material component to surface of reflecting plate, zones of solution can be located on surface of component. Reflecting plate is made of optically clear substance with refractive index n1 chosen from relationship n1