X-RAY TYPE THICKNESS GAGE

FIELD: testing thickness of belts or webs in static or dynamic mode. SUBSTANCE: thickness gage includes in addition nominal value unit. Active member of differentiating circuit is in the form of first and second connected in series field transistors whose gates are connected with outlet of nominal v...

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Bibliographische Detailangaben
Hauptverfasser:	ARTEM'EV B.V, ZAPUSKALOV V.G, EGOROV I.V, MASLOV A.I, VOLCHKOV JU.E
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	FIELD: testing thickness of belts or webs in static or dynamic mode. SUBSTANCE: thickness gage includes in addition nominal value unit. Active member of differentiating circuit is in the form of first and second connected in series field transistors whose gates are connected with outlet of nominal value unit. Drain of first transistor and source of second transistor are connected with first inlet of third amplifier. EFFECT: enlarged range of measurement, enhanced quick-action of testing, increased noise suppression in dynamic mode. 2 cl, 2 dwg