INTERFEROMETER

INTERFEROMETER

spectral analysis. SUBSTANCE: proposed interferometer includes optically coupled source of luminous radiation, reflection mirror and periodic lattice structure positioned between source of luminous radiation and reflection mirror. Periodic lattice structure is formed by system of current- conducting...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ATNASHEV P.V, BOJARCHENKOV A.S, ATNASHEV V.B, ATNASHEV A.V
Format: Patent
Sprache:eng ; rus
Schlagworte:
BASIC ELECTRIC ELEMENTS
COLORIMETRY
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
RADIATION PYROMETRY
SEMICONDUCTOR DEVICES
TESTING
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Beschreibung
Zusammenfassung:spectral analysis. SUBSTANCE: proposed interferometer includes optically coupled source of luminous radiation, reflection mirror and periodic lattice structure positioned between source of luminous radiation and reflection mirror. Periodic lattice structure is formed by system of current- conducting electrodes deposited on or into thin ( less than lambda/2) partially transmitting photoelectric layer. Two of these electrodes are interdigitated electrodes and third electrode is zigzag-shaped and embraces each of the two electrodes on three sides. Distance between first two interdigitated electrodes is equal to d/2, where d is found from formula sin = lambda/2d, where is angle of plane of photoelectric layer with wave front of luminous radiation; lambda is wave length of luminous radiation. EFFECT: raised measurement accuracy thanks to allowance for background radiation. 4 cl, 2 dwg