INTERFEROMETER

spectral analysis. SUBSTANCE: interferometer includes optically coupled source of luminous radiation, reflection mirror and photodetector made in the form of periodic lattice structure with thin photoelectric partially transmitting layer deposited on clear plate in the form of lines of above- mentio...

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Bibliographische Detailangaben
Hauptverfasser:	ATNASHEV P.V, BOJARCHENKOV A.S, ATNASHEV V.B, ATNASHEV A.V
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	BASIC ELECTRIC ELEMENTS COLORIMETRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS RADIATION PYROMETRY SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	spectral analysis. SUBSTANCE: interferometer includes optically coupled source of luminous radiation, reflection mirror and photodetector made in the form of periodic lattice structure with thin photoelectric partially transmitting layer deposited on clear plate in the form of lines of above- mentioned lattice structure Interferometer is additionally fitted with second periodic lattice structure with thin partially transmitting layer deposited in the form of lines with same period as first lattice structure. Second periodic lattice structure is located in plane of first periodic lattice structure on same clear plate and lines of second periodic lattice structure are arranged in parallel with lines of first periodic lattice structure with half-period displacement. EFFECT: increased measurement accuracy while measuring constant component of analyzed radiation thanks to allowance for background radiation. 1 dwg