POINT HIGH-INTENSITY SOURCE OF X-RAY RADIATION

X-ray microscopy. SUBSTANCE: invention refers to X-ray radiation sources having small effective size of radiation area and is intended for use in X-ray microscopes, microflaw detectors and X-ray tomographs. Point high-intensity source has electron emitter, electron focusing lenses and radiation leak...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LAZAREV P.I, KOMARDIN O.V
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY X-RAY TECHNIQUE
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