METHOD FOR MEASURING CUTTING PROCESS EMF

FIELD: cutting metals and current conductive materials, possibly for investigating their capability for cutting, at designating cutting modes and developing cutting tools. SUBSTANCE: method for measuring cutting EMF on contact surfaces of tool comprises steps of using tool the whole working part of...

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Bibliographische Detailangaben
Hauptverfasser: GLINKIN E.I, ALEKSANDROV V.I, BORODAEV A.G
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:FIELD: cutting metals and current conductive materials, possibly for investigating their capability for cutting, at designating cutting modes and developing cutting tools. SUBSTANCE: method for measuring cutting EMF on contact surfaces of tool comprises steps of using tool the whole working part of which except zones designed for measuring EMF is coated with wear resistant coating; insulating tool or blank from machine tool body; connecting tool or blank in closed electric circuit and measuring cutting process EMF. EFFECT: enhanced accuracy of measurements, enlarged manufacturing possibilities. 5 dwg, 1 tbl, 1 ex