METHOD FOR DIAGNOSING POTENTIAL COMPLICATIONS AFTER PERFORMING PHOTOREFRACTION KERATECTOMY

FIELD: medicine. SUBSTANCE: method involves examining epithelialization zone at the fourth day after carrying out photorefraction keratectomy. Maximum distance is determined between the edges of growing epithelium layer. The distance between the edges of growing epithelium layer being equal to 1.0-9...

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1. Verfasser: KURENKOV V.V
Format: Patent
Sprache:eng
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Zusammenfassung:FIELD: medicine. SUBSTANCE: method involves examining epithelialization zone at the fourth day after carrying out photorefraction keratectomy. Maximum distance is determined between the edges of growing epithelium layer. The distance between the edges of growing epithelium layer being equal to 1.0-9.0 mm, complications are predicted. EFFECT: enhanced accuracy of prognosis. 2 dwg