METHOD FOR MEASURING INTERFERENCE ORDER AND DEVICE IMPLEMENTING SAID METHOD

Bibliographische Detailangaben

Hauptverfasser:	RYUMIN ALEKSEJ V, YAKOVLEV NIKOLAJ A, MIKHALCHENKO EVGENIJ P
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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