Method and system for measuring own and mutual thermal resistances of the LED diode and phototransistor contained in the transoptor

Method and system for measuring own and mutual thermal resistances of the LED diode and phototransistor contained in the transoptor

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Hauptverfasser: ZAR BSKI JANUSZ, GORECKI KRZYSZTOF
Format: Patent
Sprache:eng ; pol
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Method and system for measuring own and mutual thermal resistances of the LED diode and phototransistor contained in the transoptor
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