INDUCTIVE MOVEMENT SENSORS

A target for an inductive displacement sensor is provided, including a plurality of conductive patterns distributed along a zone having a dimension Dtot in a direction, the patterns being defined by the overlay of at least a first set of elementary periodic patterns having a period approximately equ...

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Bibliographische Detailangaben
Hauptverfasser:	MANIOULOUX, YOHAN, LEBEDEV, GOR
Format:	Patent
Sprache:	eng ; pol
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A target for an inductive displacement sensor is provided, including a plurality of conductive patterns distributed along a zone having a dimension Dtot in a direction, the patterns being defined by the overlay of at least a first set of elementary periodic patterns having a period approximately equal to Dtot/N, including N first elementary conductive patterns of a dimension approximately equal to Dtot/2N in the direction, regularly distributed along the zone, and of a second set of elementary periodic patterns having a period approximately equal to Dtot/(N+r), including N+r second elementary patterns of a dimension approximately equal to Dtot/2(N+r) in the direction, regularly distributed along the zone, where N is an integer greater than or equal to 2 and r is a positive integer, different to zero and less than or equal to N−1, wherein first and second elementary conductive patterns overlap at least partially.