SYSTEMS AND METHODS FOR USING AN INTENSITY-MODULATED X-RAY SOURCE

The present invention is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmi...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	RUSSELL, GEORGE SCHONBERG, LANGEVELD, WILLEM G.J, JOHNSON, WILLIAM A, OWEN, ROGER D
Format:	Patent
Sprache:	eng ; pol
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!