SYSTEMS AND METHODS FOR USING AN INTENSITY-MODULATED X-RAY SOURCE

The present invention is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmi...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	RUSSELL, GEORGE SCHONBERG, LANGEVELD, WILLEM G.J, JOHNSON, WILLIAM A, OWEN, ROGER D
Format:	Patent
Sprache:	eng ; pol
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present invention is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present invention further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.