Method for determining the exact value of the linear dimension of the object and the optical measuring device

Method for determining the exact value of the linear dimension of the object and the optical measuring device

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Hauptverfasser: WIERZBICKI MICHAŁ, JABŁOŃSKI RYSZARD, MĄKOWSKI JERZY, ORZECHOWSKI JAN
Format: Patent
Sprache:eng ; pol
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator WIERZBICKI MICHAŁ
JABŁOŃSKI RYSZARD
MĄKOWSKI JERZY
ORZECHOWSKI JAN
description
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title Method for determining the exact value of the linear dimension of the object and the optical measuring device
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