Probe and system for inspecting electrically conductive components

Probe and system for inspecting electrically conductive components

A pulsed eddy current two-dimensional sensor array probe (12) for electrically conducting component inspection includes a drive coil (16) disposed adjacent to a structure under inspection, a pulse generator (20) connected to the drive coil (16) and operable to energize in a pulsed manner the drive c...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: NATH SHRIDHAR CHAMPAKNATH, BATZINGER THOMAS JAMES, PLOTNIKOV YURI ALEXEYEVICH, ROSE CURTIS WAYNE, HERD KENNETH GORDON
Format: Patent
Sprache:eng ; pol
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A pulsed eddy current two-dimensional sensor array probe (12) for electrically conducting component inspection includes a drive coil (16) disposed adjacent to a structure under inspection, a pulse generator (20) connected to the drive coil (16) and operable to energize in a pulsed manner the drive coil (16) to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors (18) arranged in a two-dimensional array and substantially surrounded by the drive coil (16) and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.