Method for operating and monitoring circuit for an electronic-mechanical position switch

The function monitoring method has a first test interval and a second test interval initiated after a given number of program cycles of the microcontroller (16) of the electronic-mechanical position switch (2). During the first test interval the dynamic watchdog signals (Vw) provided by the microcon...

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Hauptverfasser: VOLBERG, JÜRGEN, WOLFF, BERND, HÖGENER, HANS-JÜRGEN, VÖLLMAR, GUIDO
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creator VOLBERG, JÜRGEN
WOLFF, BERND
HÖGENER, HANS-JÜRGEN
VÖLLMAR, GUIDO
description The function monitoring method has a first test interval and a second test interval initiated after a given number of program cycles of the microcontroller (16) of the electronic-mechanical position switch (2). During the first test interval the dynamic watchdog signals (Vw) provided by the microcontroller, which switch between 2 logic states, are controlled for simulating failure of the microcontroller, with verification of the watchdog monitoring circuit function and during the second test interval the switching function of the switch contacts (N1,N2) is verified. An independent claim for a function monitoring circuit device for an electronic-mechanical position switch is also included.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_PL1480239TT3</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>PL1480239TT3</sourcerecordid><originalsourceid>FETCH-epo_espacenet_PL1480239TT33</originalsourceid><addsrcrecordid>eNqNijEKwkAQRdNYiHqH8QABNRZai2KhYLGFXRgmE3dgs7Psjnh9o3gAq_cf_02r-5XNawe9ZtDEGU3iAzB2MGgU0_xRkkxPsW-EETgwWR5vqgcmj-PAAEmLmGiE8hIjP68mPYbCix9n1fJ0dIdzzUlbLgmJI1t7u6y3u9Wm2TvXNP80b-VhO1M</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for operating and monitoring circuit for an electronic-mechanical position switch</title><source>esp@cenet</source><creator>VOLBERG, JÜRGEN ; WOLFF, BERND ; HÖGENER, HANS-JÜRGEN ; VÖLLMAR, GUIDO</creator><creatorcontrib>VOLBERG, JÜRGEN ; WOLFF, BERND ; HÖGENER, HANS-JÜRGEN ; VÖLLMAR, GUIDO</creatorcontrib><description>The function monitoring method has a first test interval and a second test interval initiated after a given number of program cycles of the microcontroller (16) of the electronic-mechanical position switch (2). During the first test interval the dynamic watchdog signals (Vw) provided by the microcontroller, which switch between 2 logic states, are controlled for simulating failure of the microcontroller, with verification of the watchdog monitoring circuit function and during the second test interval the switching function of the switch contacts (N1,N2) is verified. An independent claim for a function monitoring circuit device for an electronic-mechanical position switch is also included.</description><language>eng ; pol</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; BASIC ELECTRIC ELEMENTS ; ELECTRIC SWITCHES ; ELECTRICITY ; EMERGENCY PROTECTIVE DEVICES ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; RELAYS ; SELECTORS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110531&amp;DB=EPODOC&amp;CC=PL&amp;NR=1480239T3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76419</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110531&amp;DB=EPODOC&amp;CC=PL&amp;NR=1480239T3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>VOLBERG, JÜRGEN</creatorcontrib><creatorcontrib>WOLFF, BERND</creatorcontrib><creatorcontrib>HÖGENER, HANS-JÜRGEN</creatorcontrib><creatorcontrib>VÖLLMAR, GUIDO</creatorcontrib><title>Method for operating and monitoring circuit for an electronic-mechanical position switch</title><description>The function monitoring method has a first test interval and a second test interval initiated after a given number of program cycles of the microcontroller (16) of the electronic-mechanical position switch (2). During the first test interval the dynamic watchdog signals (Vw) provided by the microcontroller, which switch between 2 logic states, are controlled for simulating failure of the microcontroller, with verification of the watchdog monitoring circuit function and during the second test interval the switching function of the switch contacts (N1,N2) is verified. An independent claim for a function monitoring circuit device for an electronic-mechanical position switch is also included.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SWITCHES</subject><subject>ELECTRICITY</subject><subject>EMERGENCY PROTECTIVE DEVICES</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>RELAYS</subject><subject>SELECTORS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNijEKwkAQRdNYiHqH8QABNRZai2KhYLGFXRgmE3dgs7Psjnh9o3gAq_cf_02r-5XNawe9ZtDEGU3iAzB2MGgU0_xRkkxPsW-EETgwWR5vqgcmj-PAAEmLmGiE8hIjP68mPYbCix9n1fJ0dIdzzUlbLgmJI1t7u6y3u9Wm2TvXNP80b-VhO1M</recordid><startdate>20110531</startdate><enddate>20110531</enddate><creator>VOLBERG, JÜRGEN</creator><creator>WOLFF, BERND</creator><creator>HÖGENER, HANS-JÜRGEN</creator><creator>VÖLLMAR, GUIDO</creator><scope>EVB</scope></search><sort><creationdate>20110531</creationdate><title>Method for operating and monitoring circuit for an electronic-mechanical position switch</title><author>VOLBERG, JÜRGEN ; WOLFF, BERND ; HÖGENER, HANS-JÜRGEN ; VÖLLMAR, GUIDO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_PL1480239TT33</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; pol</language><creationdate>2011</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SWITCHES</topic><topic>ELECTRICITY</topic><topic>EMERGENCY PROTECTIVE DEVICES</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>RELAYS</topic><topic>SELECTORS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>VOLBERG, JÜRGEN</creatorcontrib><creatorcontrib>WOLFF, BERND</creatorcontrib><creatorcontrib>HÖGENER, HANS-JÜRGEN</creatorcontrib><creatorcontrib>VÖLLMAR, GUIDO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>VOLBERG, JÜRGEN</au><au>WOLFF, BERND</au><au>HÖGENER, HANS-JÜRGEN</au><au>VÖLLMAR, GUIDO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for operating and monitoring circuit for an electronic-mechanical position switch</title><date>2011-05-31</date><risdate>2011</risdate><abstract>The function monitoring method has a first test interval and a second test interval initiated after a given number of program cycles of the microcontroller (16) of the electronic-mechanical position switch (2). During the first test interval the dynamic watchdog signals (Vw) provided by the microcontroller, which switch between 2 logic states, are controlled for simulating failure of the microcontroller, with verification of the watchdog monitoring circuit function and during the second test interval the switching function of the switch contacts (N1,N2) is verified. An independent claim for a function monitoring circuit device for an electronic-mechanical position switch is also included.</abstract><oa>free_for_read</oa></addata></record>
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subjects ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
BASIC ELECTRIC ELEMENTS
ELECTRIC SWITCHES
ELECTRICITY
EMERGENCY PROTECTIVE DEVICES
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
RELAYS
SELECTORS
TARIFF METERING APPARATUS
TESTING
title Method for operating and monitoring circuit for an electronic-mechanical position switch
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T22%3A55%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=VOLBERG,%20J%C3%9CRGEN&rft.date=2011-05-31&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EPL1480239TT3%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true