Method for operating and monitoring circuit for an electronic-mechanical position switch
The function monitoring method has a first test interval and a second test interval initiated after a given number of program cycles of the microcontroller (16) of the electronic-mechanical position switch (2). During the first test interval the dynamic watchdog signals (Vw) provided by the microcon...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng ; pol |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The function monitoring method has a first test interval and a second test interval initiated after a given number of program cycles of the microcontroller (16) of the electronic-mechanical position switch (2). During the first test interval the dynamic watchdog signals (Vw) provided by the microcontroller, which switch between 2 logic states, are controlled for simulating failure of the microcontroller, with verification of the watchdog monitoring circuit function and during the second test interval the switching function of the switch contacts (N1,N2) is verified. An independent claim for a function monitoring circuit device for an electronic-mechanical position switch is also included. |
---|