INTERVIEW SYSTEM

An interview apparatus configured to obtain response information through questions and answers with an applicant, an interview controller configured to control the interview apparatus and determine an interview evaluation level which is quantification of aptitude of the applicant based on the respon...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	HENMI, Takuo
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	An interview apparatus configured to obtain response information through questions and answers with an applicant, an interview controller configured to control the interview apparatus and determine an interview evaluation level which is quantification of aptitude of the applicant based on the response information obtained by the interview apparatus, a storage device configured to store an applicant information database in which the response information and the interview evaluation level are stored in association with the applicant, and a terminal device configured to be able to access the applicant information database in the storage device are provided