ALLOY MATERIAL, CONTACT PROBE, AND CONNECTION TERMINAL

Provided are an alloy material having excellent electrical conductivity and high hardness and excellent workability for use in a contact probe, a contact probe consisting of this alloy material, and a connection terminal. In a compositional range of a ternary alloy of silver (Ag), palladium (Pd) and...

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Bibliographische Detailangaben
Hauptverfasser:	KUBOTA, TOMOHIRO, ANRAKU, TERUO, AINOYA, MASAYUKI, TOYOTAKE, KOTARO, TAKAMURA, NORITOSHI, TAKAHASHI, HUMIO, MINAMI, TOMOYUKI
Format:	Patent
Sprache:	eng
Schlagworte:	ALLOYS BASIC ELECTRIC ELEMENTS CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS ANDNON-FERROUS ALLOYS CHEMISTRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY FERROUS OR NON-FERROUS ALLOYS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES METALLURGY PHYSICS SEMICONDUCTOR DEVICES TESTING TREATMENT OF ALLOYS OR NON-FERROUS METALS
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Beschreibung
Zusammenfassung:	Provided are an alloy material having excellent electrical conductivity and high hardness and excellent workability for use in a contact probe, a contact probe consisting of this alloy material, and a connection terminal. In a compositional range of a ternary alloy of silver (Ag), palladium (Pd) and copper (Cu), Ag accounts for 17-25 at pcnt , Pd accounts for 30-45 at pcnt and Cu accounts for 30-53 at pcnt , at least one of manganese (Mn), tin (Sn), silicon (Si), antimony (Sb), titanium (Ti) and magnesium (Mg) is added at a quantity of 4.5 at pcnt or lower relative to this basic composition, and further, 0.5-3.5 at pcnt of Mn, 1-2 at pcnt of Sn, 0.5-2 at pcnt of Si, 0.5-3 at pcnt of Sb, 0.5-2 at pcnt of Ti and 0.5-3.5 at pcnt of Mg are added relative to this basic composition.