Høytemperatur borehullsverktøy
Apparatus and method for estimating a downhole parameter include a high-gain semiconductor device having a plurality of semiconductor layers forming an active region, the active region having a bandgap offset that provides device operation through at least the temperature environment of a downhole l...
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| Format: | Patent |
| Sprache: | nor |
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| Zusammenfassung: | Apparatus and method for estimating a downhole parameter include a high-gain semiconductor device having a plurality of semiconductor layers forming an active region, the active region having a bandgap offset that provides device operation through at least the temperature environment of a downhole location, the high-gain semiconductor device being used at least in part to estimate a downhole parameter. |
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