ALIGNMENT AND READOUT OF OPTICAL CHIPS

ALIGNMENT AND READOUT OF OPTICAL CHIPS

In a method or system for interrogating an optical chip (50), the optical chip (50) is illuminated With input light (30) and a spatially resolved image (50i) of the output light (31,32) is measured from the optical chip (50). The output light (31,32) is imaged together With a reflection of the input...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: BART MICHIEL DE BOER, PETER JOHAN HARMSMA
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:In a method or system for interrogating an optical chip (50), the optical chip (50) is illuminated With input light (30) and a spatially resolved image (50i) of the output light (31,32) is measured from the optical chip (50). The output light (31,32) is imaged together With a reflection of the input light (30). For example, this can be used to establish, improve, or maintain alignment of the input light (30) on a sensor input port (51) of the optical chip (50).