APPARATUS FOR AND METHOD OF IN SITU CLAMP SURFACE ROUGHENING

Disclosed is a dedicated roughening substrate provided With abrasive element useful for in situ roughening of a surface of a clamp in a semiconductor photolithography apparatus. Also disclosed is a method of using the roughening substrate in which the roughening substrate is loaded, positioned oppos...

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1. Verfasser: ENRICO ZORDAN
Format: Patent
Sprache:eng
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Zusammenfassung:Disclosed is a dedicated roughening substrate provided With abrasive element useful for in situ roughening of a surface of a clamp in a semiconductor photolithography apparatus. Also disclosed is a method of using the roughening substrate in which the roughening substrate is loaded, positioned opposite the clamp, and then pressed against the clamp and moved laterally.