MULTI-ARM STRUCTURED ILLUMINATION IMAGING

The disclosure provides for structured illumination microscopy (SIM} imaging systems (100). In one set of implementations, a SIM imaging system (100) may be implemented as a multi� arm SIM imaging system, whereby each arm of the system includes a light emitter (210A) and a beam splitter (230A) (e.g., a transmissive diffraction grating) having a specific, fixed orientation with respect to the system's optical axis. In a second set of implementations, a SIM imaging system may be implemented as a multiple beam splitter slide SIM imaging system, where one linear motion stage (410A) is mounted with multiple beam splitters having a corresponding, fixed orientation with respect to the system's optical axis. In a third set of implementations, a SIM imaging system may be implemented as a pattern angle spatial selection SIM imaging system, whereby a fixed two-dimensional diffraction grating is used in combination with a spatial filter wheel to project one-dimensional fringe patterns on a sample. (Fig. 2)