INSPECTING APPARATUS AND PROCESSING APPARATUS INCLUDING THE SAME

An inspecting apparatus (56) for inspecting a test piece (1). The inspecting apparatus (56) includes a test piece holding mechanism (58) for holding the test piece (1), the test piece holding mechanism (58) having a mounting portion (76) formed from a transparent member having upper and lower expose...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Tomoaki SUGIYAMA, Hirohiko KOZAI, Naoki MORIKAWA
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING
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