INTEGRATED TESTING AND HANDLING MECHANISM

An integrated testing and handler mechanism (100) includes 5 an input/output module (102) including: an input section (5), an output section (6), a turret that includes a plurality of pickup heads, and a shuttle configured to move the carrier (3) from the component loading location to a test module transfer location; and a test module (101) including: a test head comprising an array of a plurality of test sockets, a plunger configured to plunge the components held by the carrier (3) into the test sockets when the carrier (3) is located on the plunger, and a rotary table that includes a plurality of grippers that rotate around the rotary table, the rotary table being configured to (i) transfer a carrier (3) between the test module transfer location and an input/output module transfer location, (ii) rotate the carrier (3) between the input/output module transfer location and a plunger transfer location, and (iii) transfer the carrier (3) between the plunger transfer location and plunger. (Fig. 2)