CONTACT FOR USE IN TESTING INTEGRATED CIRCUITS

CONTACT FOR USE IN TESTING INTEGRATED CIRCUITS

A CONTACT (12) FOR USE IN A CONTACT SET ASSEMBLY. THE CONTACT (12) SPANS A SPACE WHICH SEPARATES A LEAD (20) OF AN INTEGRATED CIRCUIT (22) TO BE TESTED AND A PAD (24) OF A LOAD BOARD (26) INTERFACING WITH THE TESTER. THE CONTACT CONSTRUCTION PROVIDES ELECTRICAL COMMUNICATION BETWEEN INTEGRATED CIRCU...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: JEFFREY C. SHERRY
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A CONTACT (12) FOR USE IN A CONTACT SET ASSEMBLY. THE CONTACT (12) SPANS A SPACE WHICH SEPARATES A LEAD (20) OF AN INTEGRATED CIRCUIT (22) TO BE TESTED AND A PAD (24) OF A LOAD BOARD (26) INTERFACING WITH THE TESTER. THE CONTACT CONSTRUCTION PROVIDES ELECTRICAL COMMUNICATION BETWEEN INTEGRATED CIRCUIT (22) LEAD AND THE LOAD BOARD (26) PAD (24). INCLUDED IS AN INSULATING LAMINA (28) WHICH COMPRISES, IN PART, A CONTACT (12). A CONDUCTIVE LAMINA OVERLIES AT LEAST A PORTION OF THE INSULATING LAMINA (28). THE LAMINAR CONSTRUCTION AND SIZE AND SHAPE OF CONDUCTIVE TRACES (30) APPLIED TO A CERAMIC LAMINA ENABLE PARAMETERS OF THE CONTACT (12) TO BE PROVIDED.