METHODS AND APPARATUS FOR ESTIMATING A POSITION OF A STUCK-AT DEFECT IN A SCAN CHAIN OF A DEVICE UNDER TEST

AS A SCAN PATTERN (1010) IS SHIFTED OUT OF A SCAN CHAIN (1012), THE SCAN PATTERN IS EVALUATED IN REAL-TIME FOR THE EXISTENCE OF A LOGIC CONDITION. A REFERENCE (1016) TO A PORTION OF THE SCAN PATTERN (1010) THAT IS CURRENTLY BEING EVALUATED IS MAINTAINED. UPON IDENTIFYING THE EXISTENCE OF THE LOGIC C...

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Bibliographische Detailangaben

Hauptverfasser:	FREDIANI, JOHN, BURLISON, PHIL
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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