TEST HANDLER

TEST HANDLER

A TEST HANDLER IS DISCLOSED. THE TEST HANDLER INCLUDES FIRST TO THIRD TRANSFERS (200', 200", 200'") FOR TRANSFERRING A USER TRAY (81), AND FIRST TO THIRD HORIZONTAL MOVEMENT UNITS (300', 300", 300"') SUITABLE FOR RESPECTIVELY MOVING THE FIRST TO THIRD TRANSFER...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: IN-GU JEON, TAE-HUNG KU, YUN-SUNG NA, JAE-GYUN SHIM
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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Beschreibung
Zusammenfassung:A TEST HANDLER IS DISCLOSED. THE TEST HANDLER INCLUDES FIRST TO THIRD TRANSFERS (200', 200", 200'") FOR TRANSFERRING A USER TRAY (81), AND FIRST TO THIRD HORIZONTAL MOVEMENT UNITS (300', 300", 300"') SUITABLE FOR RESPECTIVELY MOVING THE FIRST TO THIRD TRANSFERS (200', 200", 200"') IN THE HORIZONTAL DIRECTION. THE FIRST TO THIRD HORIZONTAL MOVEMENT UNITS ARE INDEPENDENTLY OPERATED SUCH THAT EACH OF THE FIRST TO THIRD TRANSFERS (200', 200", 200"') CAN PERFORM INDEPENDENTLY HORIZONTAL MOVEMENTS. EACH OF THE FIRST TO THIRD TRANSFERS (200', 200", 200"') PERFORMS BASED ON ITS PREVIOUSLY ALLOCATED FUNCTION, THEREBY ENHANCING TEST PROCESS SPEED FOR DEVICES.