BEAM CURRENT MEASUREMENT

BEAM CURRENT MEASUREMENT

IN A BEAM CURRENT MEASUREMENT DEVICE, COMPRISING AN OUTPUT TRANSISTOR (T1) FOR SUPPLYING A CATHODE CURRENT (IC), A MEASUREMENT OUTPUT (OUTM) FOR SUPPLYING A MEASURED CURRENT (IM) REPRESENTING THE CATHODE CURRENT (IC), A FIRST CURRENT SOURCE (IBIAS1) COUPLED TO A FIRST MAIN TERMINAL OF THE OUTPUT TRA...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: PIETER VAN DER ZEE
Format: Patent
Sprache:eng
Schlagworte:
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
PICTORIAL COMMUNICATION, e.g. TELEVISION
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Zusammenfassung:IN A BEAM CURRENT MEASUREMENT DEVICE, COMPRISING AN OUTPUT TRANSISTOR (T1) FOR SUPPLYING A CATHODE CURRENT (IC), A MEASUREMENT OUTPUT (OUTM) FOR SUPPLYING A MEASURED CURRENT (IM) REPRESENTING THE CATHODE CURRENT (IC), A FIRST CURRENT SOURCE (IBIAS1) COUPLED TO A FIRST MAIN TERMINAL OF THE OUTPUT TRANSISTOR (T1) FOR SUPPLYING A FIRST CURRENT (IBIAS1), AND A SECOND CURRENT SOURCE (IBIAS2) COUPLED TO A SECOND MAIN TERMINAL OF THE OUTPUT TRANSISTOR (T1) FOR SUPPLYING A SECOND CURRENT (IBIAS2) SUBSTANTIALLY EQUAL TO THE FIRST CURRENT (IBIAS1), A FIRST CASCODE TRANSISTOR (TA) IS COUPLED BETWEEN THE FIRST MAIN TERMINAL OF THE OUTPUT TRANSISTOR (T1) AND THE MEASUREMENT OUTPUT (OUTM).(FIG. 1)