METHOD AND APPARATUS FOR INSPECTING AN OBJECT

AN INSPECTION APPARATUS IS PROVIDED FOR INSPECTING SEMICONDUCTOR DEVICES ARRANGED ON A CARRIER TRAY. THE APPARATUS INCLUDES A TOP SURFACE AND MARK (TSM) INSPECTION STATION (4), FIRST PICK AN PLACE MEANS (2) FOR TRANSPORTING THE DEVICES BETWEEN THE CARRIER TRAY AND THE TSM INSPECTION STATION, A SOLDE...

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Bibliographische Detailangaben

1. Verfasser:	TAN CHIN HIANG
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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