CAPACITOR MANUFACTURE METHOD OF HIGH INTEGRATED SEMICONDUCTOR DEVICE

forming a storage electrode poly(9) connected to a semiconductor substrate; depositing a thin oxide film(10); forming a rugged oxide film(10) by etching the thin oxide film(10); forming a ruggedness on the surface of the storage electrode poly(9) by etching the storage electrode poly(9) using the ru...

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Hauptverfasser: LEE, BYUNG-SUK, JUNG, EUI-SAM, KIM, KYUNG-JIN
Format: Patent
Sprache:eng
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Zusammenfassung:forming a storage electrode poly(9) connected to a semiconductor substrate; depositing a thin oxide film(10); forming a rugged oxide film(10) by etching the thin oxide film(10); forming a ruggedness on the surface of the storage electrode poly(9) by etching the storage electrode poly(9) using the rugged oxide film(10) as a mask; and forming a storage electrode by an etching process using a storage electrode mask(8).