A METHOD FOR INSPECTION OF DISPLAY DEVICE AND APPARATUS FOR INSPECTION OF DISPLAY DEVICE

One embodiment of the present invention discloses a method for inspection of a display device, comprising the following steps: preparing a substrate comprising a display area and a current test area, a first electrode and a second electrode disposed in the current test area and spaced apart from eac...

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Bibliographische Detailangaben
Hauptverfasser:	CHOI JUN HEE, HONG JAE CHUL, BYEON SUNG YONG, KANG YOON SU
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING ELECTRIC VARIABLES MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	One embodiment of the present invention discloses a method for inspection of a display device, comprising the following steps: preparing a substrate comprising a display area and a current test area, a first electrode and a second electrode disposed in the current test area and spaced apart from each other in a longitudinal direction of the substrate, and a first layer disposed in the current test area and electrically connecting the first electrode and the second electrode; and applying a first voltage and a second voltage to the first electrode and the second electrode, respectively, and measuring a current value flowing in the first layer. 본 발명의 일 실시예는, 표시영역과 전류검사영역을 포함하는 기판, 상기 전류검사영역에 배치되고 상기 기판의 길이 방향으로 서로 이격된 제1전극과 제2전극, 및 상기 전류검사영역에 배치되고 상기 제1전극과 상기 제2전극을 전기적으로 연결하는 제1층을 포함하는 디스플레이 기판을 준비하는 단계; 및 상기 제1전극 및 상기 제2전극에 각각 제1전압 및 제2전압을 인가하고 상기 제1층에 흐르는 전류값을 측정하는 단계;를 포함하는, 표시 장치의 검사 방법을 개시한다.