INTEGRATED CIRCUIT DEVICES INCLUDING METAL LINES SPACED APART FROM METAL VIAS AND RELATED FABRICATION METHODS

Provided are integrated circuit devices. The integrated circuit device includes a first insulating layer and a metal via that is in the first insulating layer. The integrated circuit device includes a second insulating layer on the first insulating layer. The integrated circuit device includes a con...

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Bibliographische Detailangaben
Hauptverfasser: HONG WON HYUK, LEE JANG GEUN, CHOI JAE MYUNG, SEO KANG ILL
Format: Patent
Sprache:eng ; kor
Schlagworte:
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Beschreibung
Zusammenfassung:Provided are integrated circuit devices. The integrated circuit device includes a first insulating layer and a metal via that is in the first insulating layer. The integrated circuit device includes a second insulating layer on the first insulating layer. The integrated circuit device includes a conductive material that is between sidewalls of the second insulating layer and on the metal via. Moreover, the integrated circuit device includes a metal line that is on the conductive material and/or the second insulating layer. In addition, related methods for forming integrated circuit devices are also provided. 집적회로 소자가 제공된다. 집적회로 소자는 제1 절연층 및 제1 절연층 내에 있는 금속 비아를 포함한다. 집적회로 소자는 제1 절연층 상에 있는 제2 절연층을 포함한다. 집적회로 소자는 제2 절연층의 측벽들 및 금속 비아 상 사이에 있는 전도성 재료를 포함한다. 또한, 집적회로 소자는 전도성 재료 및/또는 제2 절연층 위에 있는 금속 라인을 포함한다. 또한, 집적회로 소자들을 형성하는 관련된 방법들이 제공된다.