SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

The present invention relates to a semiconductor device provided with a high-integration memory cell and a manufacturing method therefor, which may improve the reliability of the semiconductor device. The method for manufacturing a semiconductor device according to the present invention may comprise...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	YOON HYE WON, KIM SEUNG HWAN
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	ELECTRICITY
Online-Zugang:	Volltext bestellen
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