MUON TOMOGRAPHY APPARATUS

According to the present invention, a muon tomography apparatus comprises: an upper detector positioned above an inspection target to detect the amount and direction of muons incident on the inspection target; a lower detector positioned below the inspection object to detect the amount and direction...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	JAEHYUN LEE, YOENG HEUM YEON, JAE YEON PARK, JUNGHO MUN, MOONSIK CHAE
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	DETECTING MASSES OR OBJECTS GEOPHYSICS GRAVITATIONAL MEASUREMENTS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	According to the present invention, a muon tomography apparatus comprises: an upper detector positioned above an inspection target to detect the amount and direction of muons incident on the inspection target; a lower detector positioned below the inspection object to detect the amount and direction of muons that change after passing through the inspection object; and a magnetic device located above the upper detector to induce muons to the inspection target. According to the present invention, the time required for existing muon tomography can be reduced by about 2/3 to 3/4. 본 발명에 따른 뮤온 토모그래피 장치는, 검사대상으로 입사하는 뮤온의 양과 방향을 검출하기 위해, 상기 검사대상의 상측에 위치하도록 마련되는 상단 검출기; 상기 검사대상을 투과한 뒤 변화한 뮤온의 양과 방향을 검출하기 위해, 상기 검사대상의 하측에 위치하도록 마련되는 하단 검출기; 및 상기 검사대상으로 뮤온을 유도하도록, 상기 상단 검출기의 상측에 위치하는 자기장치를 포함한다.