An X-ray Apparatus for Investigating an Inside of an Article
The purpose of the present invention is to provide an X-ray apparatus for inspecting the inside of an article, which is installed on a transport path of an article and can inspect the inside of the article from X-ray images of different positions of the article. The present invention relates to an X...
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| creator | YOUNG BOK GO YEONG NAM KIM HYEONG CHEOL KIM YONG HAN JANG TAE YUNLEE JAE DONGLEE |
| description | The purpose of the present invention is to provide an X-ray apparatus for inspecting the inside of an article, which is installed on a transport path of an article and can inspect the inside of the article from X-ray images of different positions of the article. The present invention relates to an X-ray apparatus for inspecting the inside of an article. The X-ray apparatus for inspecting the inside of an article comprises a shuttle (11a) for transporting articles (B1, B2); at least one inspection path (13_1 to 13_N) installed inside an inspection room (R); at least one inspection module (14a, 14b) movably disposed on the inspection path (13_1 to 13_N); and article transport means (12a, 12b) for moving the articles (B1, B2) to the inside or outside of the inspection path (13_1 to 13_N).
본 발명은 물품 내부 검사용 엑스레이 검사 장치에 관한 것이다. 물품 내부 검사용 엑스레이 장치는 물품(B1, B2)의 이송을 위한 셔틀(11a); 검사실(R)의 내부에 설치되는 적어도 하나의 검사 경로(13_1 내지 13_N); 검사 경로(13_1 내지 13_N)에 이동 가능하도록 배치되는 적어도 하나의 검사 모듈(14a, 14b); 및 검사 경로(13_1 내지 13_N)의 내부로 또는 검사 경로의 외부로 물품(B1, B2)을 이동시키는 물품 운반 수단(12a, 12b)을 포함한다. |
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본 발명은 물품 내부 검사용 엑스레이 검사 장치에 관한 것이다. 물품 내부 검사용 엑스레이 장치는 물품(B1, B2)의 이송을 위한 셔틀(11a); 검사실(R)의 내부에 설치되는 적어도 하나의 검사 경로(13_1 내지 13_N); 검사 경로(13_1 내지 13_N)에 이동 가능하도록 배치되는 적어도 하나의 검사 모듈(14a, 14b); 및 검사 경로(13_1 내지 13_N)의 내부로 또는 검사 경로의 외부로 물품(B1, B2)을 이동시키는 물품 운반 수단(12a, 12b)을 포함한다.</description><language>eng ; kor</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230818&DB=EPODOC&CC=KR&NR=20230121596A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230818&DB=EPODOC&CC=KR&NR=20230121596A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YOUNG BOK GO</creatorcontrib><creatorcontrib>YEONG NAM KIM</creatorcontrib><creatorcontrib>HYEONG CHEOL KIM</creatorcontrib><creatorcontrib>YONG HAN JANG</creatorcontrib><creatorcontrib>TAE YUNLEE</creatorcontrib><creatorcontrib>JAE DONGLEE</creatorcontrib><title>An X-ray Apparatus for Investigating an Inside of an Article</title><description>The purpose of the present invention is to provide an X-ray apparatus for inspecting the inside of an article, which is installed on a transport path of an article and can inspect the inside of the article from X-ray images of different positions of the article. The present invention relates to an X-ray apparatus for inspecting the inside of an article. The X-ray apparatus for inspecting the inside of an article comprises a shuttle (11a) for transporting articles (B1, B2); at least one inspection path (13_1 to 13_N) installed inside an inspection room (R); at least one inspection module (14a, 14b) movably disposed on the inspection path (13_1 to 13_N); and article transport means (12a, 12b) for moving the articles (B1, B2) to the inside or outside of the inspection path (13_1 to 13_N).
본 발명은 물품 내부 검사용 엑스레이 검사 장치에 관한 것이다. 물품 내부 검사용 엑스레이 장치는 물품(B1, B2)의 이송을 위한 셔틀(11a); 검사실(R)의 내부에 설치되는 적어도 하나의 검사 경로(13_1 내지 13_N); 검사 경로(13_1 내지 13_N)에 이동 가능하도록 배치되는 적어도 하나의 검사 모듈(14a, 14b); 및 검사 경로(13_1 내지 13_N)의 내부로 또는 검사 경로의 외부로 물품(B1, B2)을 이동시키는 물품 운반 수단(12a, 12b)을 포함한다.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLBxzFOI0C1KrFRwLChILEosKS1WSMsvUvDMK0stLslMTyzJzEtXSMwDChRnpqQq5KeBOI5FJZnJOak8DKxpiTnFqbxQmptB2c01xNlDN7UgPz61uCAxOTUvtSTeO8jIwMjYwNDI0NTSzNGYOFUAFicvhA</recordid><startdate>20230818</startdate><enddate>20230818</enddate><creator>YOUNG BOK GO</creator><creator>YEONG NAM KIM</creator><creator>HYEONG CHEOL KIM</creator><creator>YONG HAN JANG</creator><creator>TAE YUNLEE</creator><creator>JAE DONGLEE</creator><scope>EVB</scope></search><sort><creationdate>20230818</creationdate><title>An X-ray Apparatus for Investigating an Inside of an Article</title><author>YOUNG BOK GO ; YEONG NAM KIM ; HYEONG CHEOL KIM ; YONG HAN JANG ; TAE YUNLEE ; JAE DONGLEE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20230121596A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2023</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YOUNG BOK GO</creatorcontrib><creatorcontrib>YEONG NAM KIM</creatorcontrib><creatorcontrib>HYEONG CHEOL KIM</creatorcontrib><creatorcontrib>YONG HAN JANG</creatorcontrib><creatorcontrib>TAE YUNLEE</creatorcontrib><creatorcontrib>JAE DONGLEE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YOUNG BOK GO</au><au>YEONG NAM KIM</au><au>HYEONG CHEOL KIM</au><au>YONG HAN JANG</au><au>TAE YUNLEE</au><au>JAE DONGLEE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>An X-ray Apparatus for Investigating an Inside of an Article</title><date>2023-08-18</date><risdate>2023</risdate><abstract>The purpose of the present invention is to provide an X-ray apparatus for inspecting the inside of an article, which is installed on a transport path of an article and can inspect the inside of the article from X-ray images of different positions of the article. The present invention relates to an X-ray apparatus for inspecting the inside of an article. The X-ray apparatus for inspecting the inside of an article comprises a shuttle (11a) for transporting articles (B1, B2); at least one inspection path (13_1 to 13_N) installed inside an inspection room (R); at least one inspection module (14a, 14b) movably disposed on the inspection path (13_1 to 13_N); and article transport means (12a, 12b) for moving the articles (B1, B2) to the inside or outside of the inspection path (13_1 to 13_N).
본 발명은 물품 내부 검사용 엑스레이 검사 장치에 관한 것이다. 물품 내부 검사용 엑스레이 장치는 물품(B1, B2)의 이송을 위한 셔틀(11a); 검사실(R)의 내부에 설치되는 적어도 하나의 검사 경로(13_1 내지 13_N); 검사 경로(13_1 내지 13_N)에 이동 가능하도록 배치되는 적어도 하나의 검사 모듈(14a, 14b); 및 검사 경로(13_1 내지 13_N)의 내부로 또는 검사 경로의 외부로 물품(B1, B2)을 이동시키는 물품 운반 수단(12a, 12b)을 포함한다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | An X-ray Apparatus for Investigating an Inside of an Article |
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