MEMORY DEVICE AND OPERATING METHOD THEREOF

According to one embodiment, provided is an operating method of a memory device, which includes the steps of: obtaining the address of a defective word line within a plurality of word lines; detecting whether word lines adjacent to the defective word line are defective based on the address of the de...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: JUNG SUNG KWAN, JUNG DOO YEUN, SON MYOUNG HO
Format: Patent
Sprache:eng ; kor
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Beschreibung
Zusammenfassung:According to one embodiment, provided is an operating method of a memory device, which includes the steps of: obtaining the address of a defective word line within a plurality of word lines; detecting whether word lines adjacent to the defective word line are defective based on the address of the defective word line; designating a first word line detected as defective among the adjacent word lines as a prohibited word line; and recording data on a second word line detected as normal among the adjacent word lines. 일 실시예에 따른 메모리 장치 동작 방법은, 복수의 워드라인 내 불량 워드라인의 주소를 획득하는 단계; 상기 불량 워드라인의 주소에 기초하여 상기 불량 워드라인에 인접한 워드라인의 불량 여부를 검출하는 단계; 상기 인접한 워드라인 중 불량으로 검출된 제1 워드라인을 사용 금지 워드라인으로 지정하는 단계; 및 상기 인접한 워드라인 중 정상으로 검출된 제2 워드라인에 데이터를 기록하는 단계를 포함한다.